Detection of Transmutational Elements in Copper by Means of Total-Reflection X-Ray-Fluorescence Spectrometry Using Synchrotron-Radiation
1995
Abstract
High-purity copper samples were irradiated with high-energy protons and neutrons, The concentration of transmutational elements was measured by means of the total reflection x-ray fluorescence method using synchrotron radiation, The spectra of non-irradiated samples were substracted from the spectra of the irradiated samples, By this evaluation method, the minimum detectable concentration was as low as 1.5 mu g g(-1) in a copper matrix.
Details
Title
Detection of Transmutational Elements in Copper by Means of Total-Reflection X-Ray-Fluorescence Spectrometry Using Synchrotron-Radiation
Author(s)
Hegedus, F. ; Wobrauschek, P. ; Streli, C. ; Winkler, P. ; Rieder, R. ; Ladisich, W. ; Victoria, M. ; Ryon, R. W. ; Sommer, W. F.
Published in
X-Ray Spectrometry
Volume
24
Issue
5
Pages
253-254
Date
1995
ISSN
0049-8246
Other identifier(s)
View record in Web of Science
Laboratories
CRPP
SPC
SPC
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > SPC - Swiss Plasma Center > SPC - Swiss Plasma Center
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2008-04-16