Experimental Method for a High Accuracy Reflectivity Spectrum Measurements
1998
Details
Title
Experimental Method for a High Accuracy Reflectivity Spectrum Measurements
Author(s)
Berseth, C.A. ; Schoenberg, A. ; Dehaese, O. ; Rudra, A. ; Kapon, E.
Published in
Applied Optics
Volume
37
Pages
6671-6676
Date
1998
Other identifier(s)
View record in Web of Science
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPN - Laboratory of the Physics of Nanostructures
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2008-02-29