Cross-Sectional Atomic Force Microscopy of Semiconductor Nanostructures
1995
Details
Title
Cross-Sectional Atomic Force Microscopy of Semiconductor Nanostructures
Author(s)
Dwir, B. ; Reinhardt, F. ; Kapon, E.
Published in
Journal of Applied Physics
Volume
78
Pages
4939-4942
Date
1995
Other identifier(s)
View record in Web of Science
Laboratories
LPN
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPN - Laboratory of the Physics of Nanostructures
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2008-02-29