000117976 001__ 117976
000117976 005__ 20180317095232.0
000117976 0247_ $$2doi$$a10.1063/1.359783
000117976 02470 $$2ISI$$aA1995RY39600019
000117976 037__ $$aARTICLE
000117976 245__ $$aCross-Sectional Atomic Force Microscopy of Semiconductor Nanostructures
000117976 269__ $$a1995
000117976 260__ $$c1995
000117976 336__ $$aJournal Articles
000117976 700__ $$0240081$$aDwir, B.$$g105040
000117976 700__ $$aReinhardt, F.
000117976 700__ $$0240239$$aKapon, E.$$g105530
000117976 773__ $$j78$$q4939-4942$$tJ. Appl. Phys.
000117976 909CO $$ooai:infoscience.tind.io:117976$$particle$$pSB
000117976 909C0 $$0252035$$pLPN$$xU10158
000117976 937__ $$aLPN-ARTICLE-1995-001
000117976 973__ $$aEPFL$$rREVIEWED$$sPUBLISHED
000117976 980__ $$aARTICLE