Extended focus depth for Fourier domain optical coherence microscopy

We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of ∼1.5 μm along a focal range of 200 μm is experimentally verified with a maximum sensitivity of 105 dB. A broad-bandwidth Ti:sapphire laser allowed for an axial resolution of 3 μm in air.


Published in:
Optics Letters, 31, 16, 2450-2452
Year:
2006
Keywords:
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Note: The status of this file is: EPFL only


 Record created 2008-02-25, last modified 2018-03-17

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