A 90nm CMOS Cryptographic Core with Improved Fault- Tolerance in Presence of Massive Defect Density
2007
Details
Title
A 90nm CMOS Cryptographic Core with Improved Fault- Tolerance in Presence of Massive Defect Density
Author(s)
Stanisavljevic, M. ; Gürkaynak, F. K. ; Schmid, A. ; Leblebici, Y. ; Gabrani, M.
Published in
Proceedings of the International Conference on Nano-Networks, Nano-Net
Conference
International Conference on Nano-Networks, Nano-Net, Catania, Italy, September 24-26
Date
2007
Laboratories
LSM
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSM - Microelectronic Systems Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2008-01-08