000114558 001__ 114558
000114558 005__ 20190316234102.0
000114558 020__ $$a978-3-9810801-3-1
000114558 02470 $$2ISI$$a000257940700021
000114558 037__ $$aCONF
000114558 245__ $$aTemperature Control of High Performance Multicore Platforms Using Convex Optimization
000114558 260__ $$c2008
000114558 269__ $$a2008
000114558 336__ $$aConference Papers
000114558 520__ $$aWith technology advances, the number of cores integrated on a chip and their speed of operation is increasing. This, in turn is leading to a significant increase in chip temperature. Temperature gradi- ents and hot-spots not only affect the performance of the system, but also lead to unreliable circuit operation and affect the life-time of the chip. Meeting the temperature constraints and reducing the hot-spots are critical for achieving reliable and efficient operation of complex multi-core systems. In this work, we present Pro-Temp, a convex optimization based method that pro-actively controls the temperature of the cores, while minimizing the power consumption and satisfying application performance constraints. The method guarantees that the temperature of the cores are below a user- defined threshold at all instances of operation, while also reducing the hot-spots. We perform experiments on several realistic multi- core benchmarks, which show that the proposed method guarantees that the cores never exceed the maximum temperature limit, while matching the application performance requirements. We compare this to traditional methods, where we find several temperature vio- lations during the operation of the system.
000114558 6531_ $$aThermal-aware design
000114558 6531_ $$aTemperature control
000114558 6531_ $$aDynamic frequency scaling
000114558 6531_ $$aStatic and dynamic optimization
000114558 700__ $$0242414$$g171633$$aMurali, Srinivasan
000114558 700__ $$0240268$$g169199$$aAtienza, David
000114558 700__ $$g171049$$aBenini, Luca$$0243773
000114558 700__ $$aDe Micheli, Giovanni$$g167918$$0240269
000114558 7112_ $$dMarch 10-14, 2008$$cMunich, Germany$$aDesign, Automation and Test in Europe Conference (DATE '08)
000114558 773__ $$tProceedings of the Design, Automation and Test in Europe Conference (DATE)
000114558 8564_ $$uhttps://infoscience.epfl.ch/record/114558/files/DATE2008-paper01.7_4.PDF$$zn/a$$s235063$$yn/a
000114558 909C0 $$xU11140$$0252283$$pLSI1
000114558 909C0 $$0252050$$pESL$$xU11977
000114558 909CO $$qGLOBAL_SET$$pconf$$pSTI$$pIC$$ooai:infoscience.tind.io:114558
000114558 917Z8 $$x169199
000114558 917Z8 $$x176271
000114558 917Z8 $$x112915
000114558 937__ $$aEPFL-CONF-114558
000114558 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000114558 980__ $$aCONF