Electrical Characterisation of High Voltage MOSFETs using MESDRIFT
2003
Details
Title
Electrical Characterisation of High Voltage MOSFETs using MESDRIFT
Author(s)
Anghel, C. ; Hefyene, N. ; Vermandel, M. ; Bakeroot, B. ; Doutreloigne, J. ; Gillon, R. ; Ionescu, A. M.
Published in
2003 International Semiconductor Conference. CAS 2003 Proceedings
Volume
2
Pages
257-260
Date
2003
Other identifier(s)
View record in Web of Science
Laboratories
NANOLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NANOLAB - Nanoelectronic Devices Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-10-10