New Method for Temperature-Dependent Thermal Resistance and Capacitance Accurate Extraction in DMOS Transistors
2003
Details
Title
New Method for Temperature-Dependent Thermal Resistance and Capacitance Accurate Extraction in DMOS Transistors
Author(s)
Anghel, C. ; Hefyene, N. ; Gillon, R. ; Tack, M. ; Declercq, M. J. ; Ionescu, A. M.
Published in
IEEE International Electron Devices Meeting 2003
Pages
5.6.1-5.6.4
Date
2003
Laboratories
NANOLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NANOLAB - Nanoelectronic Devices Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-10-10