Self-Heating Characterization and Extraction Method for Thermal Resistance and Capacitance in High Voltage MOSFETs
2003
Details
Title
Self-Heating Characterization and Extraction Method for Thermal Resistance and Capacitance in High Voltage MOSFETs
Author(s)
Anghel, C. ; Hefyene, N. ; Gillon, R. ; Ionescu, A. M.
Published in
ESSDERC '03. 33rd Conference on European Solid-State Device Research
Pages
449-452
Date
2003
Other identifier(s)
View record in Web of Science
Laboratories
NANOLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NANOLAB - Nanoelectronic Devices Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-10-10