Bias-dependent drift resistance modeling for accurate DC and AC simulation of asymmetric HV-MOSFET
2002
Details
Title
Bias-dependent drift resistance modeling for accurate DC and AC simulation of asymmetric HV-MOSFET
Author(s)
Hefyene, N. ; Vestiel, E. ; Bakeroot, B. ; Anghel, C. ; Frere, S. ; Ionescu, A. M. ; Gillon, R.
Published in
International Conference on Simulation of Semiconductor Processes and Devices
Pages
203-206
Conference
SISPAD 2002
Date
2002
Other identifier(s)
View record in Web of Science
Laboratories
NANOLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NANOLAB - Nanoelectronic Devices Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-10-10