Universal Test Structure and Characterization Method for Bias-Dependent Drift Series Resistance of HV MOSFETs
2002
Details
Title
Universal Test Structure and Characterization Method for Bias-Dependent Drift Series Resistance of HV MOSFETs
Author(s)
Anghel, C. ; Hefyene, N. ; Ionescu, A. M. ; Frere, S. ; Gillon, R. ; Rhayem, J.
Published in
32nd European Solid-State Device Research Conference
Pages
247-250
Conference
ESSDERC 2002
Date
2002
Laboratories
NANOLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NANOLAB - Nanoelectronic Devices Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-10-10