Self-Heating Characterization and Extraction Method for Thermal Resistance and Capacitance in High Voltage MOSFETs'


Published in:
IEEE Electron Device Letters (EDL), 25, 3, 141-143
Year:
2004
Laboratories:




 Record created 2007-10-10, last modified 2018-03-17


Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)