Noise Modeling Methodologies in the Presence of Mobility Degradation and their Equivalence


Published in:
IEEE Trans. Electron Devices, 53, 2, 348-355
Year:
2006
Publisher:
Institute of Electrical and Electronics Engineers
ISSN:
0018-9383
Keywords:
Other identifiers:
DAR: 8068
Laboratories:




 Record created 2007-10-08, last modified 2018-01-28


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