We report on a distance control system for low-temperature scanning near-field optical microscopy, based on quartz tuning fork as shear force sensor. By means of a particular tuning fork optical fiber configuration, the sensor is electrically dithered by an applied alternate voltage, without any supplementary driving piezo, as done so far. The sensitivity in the approach direction is 0.2 nm, and quality factors up to 2850 have been reached. No electronic components are needed close to the sensor, allowing to employ it in a liquid He environment. The system is extremely compact and allows for several hours of stability at 5 K. (C) 2002 Elsevier Science B.V. All rights reserved.
Title
Ultra stable tuning fork sensor for low-temperature near-field spectroscopy
Published in
Ultramicroscopy
Volume
90
Issue
2-3
Pages
97-101
Date
2002
ISSN
0304-3991
Note
Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Dept Phys, CH-1015 Lausanne, Switzerland. Electrotech Lab, Tsukuba, Ibaraki 3058568, Japan. Crottini, A, Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Dept Phys, CH-1015 Lausanne, Switzerland.
ISI Document Delivery No.: 537GA
Cited Reference Count: 14
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Record creation date
2007-08-31