Infoscience

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Transmission electron microscopy and cathodoluminescence studies of extended defects in electron-beam-pumped Zn1-xCdxSe/ZnSe blue-green lasers

We report on studies of extended defects in electron-beam-pumped Zn1-xCdxSe/ZnSe blue and blue-green laser structures. To establish a direct correlation between the local luminescence properties and the presence of structural defects, the same thin foil samples were sequentially examined by transmission electron microscopy (TEM) and cathodoluminescence (CL) microscopy. The majority of the non-radiative defects were found to have one or more threading dislocations in their vicinity. Stacking faults, as a rule, did not give rise per se to non-radiative recombination centers. In several instances we observed nonradiative defects by CL with no extended defect counterparts in TEM. (C) 1998 American Institute of Physics.

    Keywords: DARK LINE DEFECTS ; LIGHT EMITTERS ; DEGRADATION ; THRESHOLD ; GAAS

    Note:

    Ecole Polytech Fed Lausanne, Inst Micro & Optoelect, Dept Phys, CH-1015 Lausanne, Switzerland. INFM, Lab Nazl TASC, Area Ricerca, I-34012 Trieste, Italy. CEA, LETI, Dept Optron, F-38054 Grenoble, France. CNR, ICMAT, I-00016 Monterotondo, Italy. Univ Trieste, Dipartmento Fis, I-34127 Trieste, Italy. Bonard, JM, Ecole Polytech Fed Lausanne, Inst Phys Expt, Dept Phys, CH-1015 Lausanne, Switzerland.

    ISI Document Delivery No.: 108GG

    Times Cited: 4

    Cited Reference Count: 26

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    Reference

    Record created on 2007-08-31, modified on 2016-08-08

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