Degradation defects in electron-beam-pumped Zn1-xCdxSe/ZnSe graded-index separate-confinement heterostructure (GRINSCH) blue and blue-green lasers
1997
Abstract
Degradation defects induced by electron-beam bombardment in Zn1-xCdxSe/ZnSe (001) graded-index separate-confinement blue-green laser structures have been characterized by transmission electron microscopy. Most defects appear as tree-like arrangements of small extrinsic and intrinsic dislocation loops opening in +/-[100] or +/-[010] directions and are located within the quantum well or at its boundaries. The Burgers vectors of the loops were identified as b = 1/2[01(1) over bar] and b = 1/2[10(1) over bar] for defects opening in the +/-[100] and +/-[010] directions respectively.
Details
Title
Degradation defects in electron-beam-pumped Zn1-xCdxSe/ZnSe graded-index separate-confinement heterostructure (GRINSCH) blue and blue-green lasers
Author(s)
Bonard, J. M. ; Ganiere, J. D. ; Vanzetti, L. ; Paggel, J. J. ; Sorba, L. ; Franciosi, A. ; Herve, D. ; Molva, E.
Published in
Philosophical Magazine Letters
Volume
76
Issue
3
Pages
181-187
Date
1997
ISSN
0950-0839
Keywords
Note
Cnr,ist icmat,i-00016 rome,italy. univ trieste,dipartimento fis,i-34127 trieste,italy. ecole polytech fed lausanne,inst phys expt,dept phys,inst micro & optoelect,ch-1015 lausanne,switzerland. ist nazl fis mat,lab nazl tasc,i-34012 trieste,italy. dept optron,lab elect technol & instrumentat,commissariat energie atom technol avancees,f-38054 grenoble 9,france.
ISI Document Delivery No.: XU821
Cited Reference Count: 16
Cited References:
BONARD JM, 1997, IN PRESS
EDINGTON JW, 1975, PRACTICAL ELECT MICR, V3
GUHA S, 1993, APPL PHYS LETT, V63, P3107
HERVE D, 1995, APPL PHYS LETT, V67, P2144
HOVINEN M, 1995, APPL PHYS LETT, V66, P2013
HUA GC, 1994, APPL PHYS LETT, V65, P1331
HUTCHINSON PW, 1975, APPL PHYS LETT, V26, P250
NAKANO K, 1996, J ELECTRON MATER, V25, P213
OHARA S, 1977, APPL PHYS LETT, V30, P368
PETROFF P, 1974, J APPL PHYS, V45, P3899
RUHLE M, 1967, PHYS STATUS SOLIDI, V19, P263
SALAMANCARIBA L, 1996, J ELECTRON MATER, V25, P239
TANIGUCHI S, 1996, ELECTRON LETT, V32, P552
UREN GD, 1995, APPL PHYS LETT, V67, P3862
WILKENS M, 1972, PHYS STATUS SOLIDI B, V49, P749
WILKENS M, 1978, DIFFRACTION IMAGING
ISI Document Delivery No.: XU821
Cited Reference Count: 16
Cited References:
BONARD JM, 1997, IN PRESS
EDINGTON JW, 1975, PRACTICAL ELECT MICR, V3
GUHA S, 1993, APPL PHYS LETT, V63, P3107
HERVE D, 1995, APPL PHYS LETT, V67, P2144
HOVINEN M, 1995, APPL PHYS LETT, V66, P2013
HUA GC, 1994, APPL PHYS LETT, V65, P1331
HUTCHINSON PW, 1975, APPL PHYS LETT, V26, P250
NAKANO K, 1996, J ELECTRON MATER, V25, P213
OHARA S, 1977, APPL PHYS LETT, V30, P368
PETROFF P, 1974, J APPL PHYS, V45, P3899
RUHLE M, 1967, PHYS STATUS SOLIDI, V19, P263
SALAMANCARIBA L, 1996, J ELECTRON MATER, V25, P239
TANIGUCHI S, 1996, ELECTRON LETT, V32, P552
UREN GD, 1995, APPL PHYS LETT, V67, P3862
WILKENS M, 1972, PHYS STATUS SOLIDI B, V49, P749
WILKENS M, 1978, DIFFRACTION IMAGING
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2007-08-31