Degradation and defects in electron-beam-pumped Zn1-xCdxSe/ZnSe GRINSCH blue-green lasers

We explore the defect distribution and the degradation in electron beam pumped Zn1-xCdxSe/ZnSe laser structures by combining cathodoluminescence measurements in a scanning electron microscope with transmission electron microscopy. We found that degradation occurs via the formation of [100]-oriented dark line defects, and that it involves the formation of a characteristic type of defect, namely dislocation loops within the ZnCdSe quantum well, which grow to form a characteristic network as degradation processes.


Published in:
Defect Recognition and Image Processing in Semiconductors 1995, 149, 207-212
Year:
1996
Publisher:
Iop Publishing Ltd
ISSN:
0951-3248
Note:
Cea technol avancees,leti,dept optron,f-38054 grenoble,france. infm,tasc,lab natl,i-34012 trieste,italy. Bonard, JM, ECOLE POLYTECH FED LAUSANNE,INST MICRO & OPTOELECTR,DEPT PHYS,CH-1015 LAUSANNE,SWITZERLAND.
ISI Document Delivery No.: BF72M
Times Cited: 0
Cited Reference Count: 11
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Article
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