Cathodoluminescence and transmission electron microscopy investigation of ZnCdSe/ZnSe electron-beam-pumped laser structures

We present results obtained both with scanning electron microscopy (SEM) in the cathodoluminescence (CL) mode and transmission electron microscopy (TEM) on ZnCdSe/ZnSe electron-beam-pumped laser structures. This investigation aims at establishing a relationship between different parameters measurable in electron microscopy and the lasing activity of the structures.


Published in:
Microscopy of Semiconducting Materials 1995, 146, 755-758
Year:
1995
Publisher:
Iop Publishing Ltd
ISSN:
0951-3248
Note:
Infm,lab tasc,i-34012 trieste,italy. cea technol avancees,leti,dept optr,f-38054 grenoble 9,france. Bonard, JM, ECOLE POLYTECH FED LAUSANNE,INST MICRO & OPTOELECTR,DEPT PHYS,CH-1015 LAUSANNE,SWITZERLAND.
ISI Document Delivery No.: BE73Q
Times Cited: 1
Cited Reference Count: 5
Cited References:
BONARD JM, 1995, UNPUB
CHEN Y, 1994, APPL PHYS LETT, V65, P549
HERVE D, 1995, IN PRESS ELECTRON LE
JOUNEAU PH, 1993, THESIS I NATIONAL PO, P53
LOZYKOWSKI HJ, 1991, J APPL PHYS, V69, P3235
Article
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 Record created 2007-08-31, last modified 2018-03-17


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