Transmission Electron-Microscopy of Surfaces and Interfaces

Modern transmission electron microscopes offer imaging capabilities down to the atomic lattice resolution, as well as crystallographic and chemical microanalysis with 2-nanometer diameter probes in thin foils. These analytical microscopes are powerful tools for surface, interface and thin films studies.


Publié dans:
Analusis, 21, 8, M6-&
Année
1993
ISSN:
0365-4877
Note:
Buffat, pa, ecole polytech fed lausanne,inst interdept microscopie electr i2m,ch-1015 lausanne,switzerland.
ISI Document Delivery No.: MG001
Times Cited: 1
Cited Reference Count: 10
Cited References:
BUFFAT PA, 1991, FARADAY DISCUSS, V92, P173
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FITZGERALD AG, 1993, QANTITATIVE MICROBEA
HSU T, 1992, MICROSC RES TECHNIQ, V20, P318
OURMAZD A, 1990, ULTRAMICROSCOPY, V34, P237
REIMER L, 1984, TRANSMISSION ELECTRO
SPENCE JCH, 1981, EXPT HIGH RESOLUTION
STADELMANN PA, 1987, ULTRAMICROSCOPY, V21, P131
TONOMURA A, 1984, J ELECTRON MICROSC, V33, P101
ZHANG X, 1993, ULTRAMICROSCOPY, V51, P21
Laboratoires:




 Notice créée le 2007-08-31, modifiée le 2019-02-13


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