Transmission Electron-Microscopy of Surfaces and Interfaces
Buffat, P. A.; Catana, A.; Flueli, M.; Ganiere, J. D.; Rosenfeld, D.; Stadelmann, P.; Verdon, C.
1993

Abstract

Modern transmission electron microscopes offer imaging capabilities down to the atomic lattice resolution, as well as crystallographic and chemical microanalysis with 2-nanometer diameter probes in thin foils. These analytical microscopes are powerful tools for surface, interface and thin films studies.

Details

Title Transmission Electron-Microscopy of Surfaces and Interfaces
Author(s) Buffat, P. A. ; Catana, A. ; Flueli, M. ; Ganiere, J. D. ; Rosenfeld, D. ; Stadelmann, P. ; Verdon, C.
Published in Analusis
Volume 21
Issue 8
Pages M6-M11
Date 1993
ISSN 0365-4877
Note Buffat, pa, ecole polytech fed lausanne,inst interdept microscopie electr i2m,ch-1015 lausanne,switzerland.
ISI Document Delivery No.: MG001
Cited Reference Count: 10
Cited References:
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CATANA A, 1989, I PHYS C SER, V100, P621
FITZGERALD AG, 1993, QANTITATIVE MICROBEA
HSU T, 1992, MICROSC RES TECHNIQ, V20, P318
OURMAZD A, 1990, ULTRAMICROSCOPY, V34, P237
REIMER L, 1984, TRANSMISSION ELECTRO
SPENCE JCH, 1981, EXPT HIGH RESOLUTION
STADELMANN PA, 1987, ULTRAMICROSCOPY, V21, P131
TONOMURA A, 1984, J ELECTRON MICROSC, V33, P101
ZHANG X, 1993, ULTRAMICROSCOPY, V51, P21
Other identifier(s) View record in Web of Science
Laboratories LOEQ
CIME
Record Appears in Scientific production and competences > SB - School of Basic Sciences > SB Archives > LOEQ - Laboratory of Quantum Optoelectronics
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date 2007-08-31

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