Transmission Electron-Microscopy of Surfaces and Interfaces
1993
Abstract
Modern transmission electron microscopes offer imaging capabilities down to the atomic lattice resolution, as well as crystallographic and chemical microanalysis with 2-nanometer diameter probes in thin foils. These analytical microscopes are powerful tools for surface, interface and thin films studies.
Details
Title
Transmission Electron-Microscopy of Surfaces and Interfaces
Author(s)
Buffat, P. A. ; Catana, A. ; Flueli, M. ; Ganiere, J. D. ; Rosenfeld, D. ; Stadelmann, P. ; Verdon, C.
Published in
Analusis
Volume
21
Issue
8
Pages
M6-M11
Date
1993
ISSN
0365-4877
Note
Buffat, pa, ecole polytech fed lausanne,inst interdept microscopie electr i2m,ch-1015 lausanne,switzerland.
ISI Document Delivery No.: MG001
Cited Reference Count: 10
Cited References:
BUFFAT PA, 1991, FARADAY DISCUSS, V92, P173
CATANA A, 1989, I PHYS C SER, V100, P621
FITZGERALD AG, 1993, QANTITATIVE MICROBEA
HSU T, 1992, MICROSC RES TECHNIQ, V20, P318
OURMAZD A, 1990, ULTRAMICROSCOPY, V34, P237
REIMER L, 1984, TRANSMISSION ELECTRO
SPENCE JCH, 1981, EXPT HIGH RESOLUTION
STADELMANN PA, 1987, ULTRAMICROSCOPY, V21, P131
TONOMURA A, 1984, J ELECTRON MICROSC, V33, P101
ZHANG X, 1993, ULTRAMICROSCOPY, V51, P21
ISI Document Delivery No.: MG001
Cited Reference Count: 10
Cited References:
BUFFAT PA, 1991, FARADAY DISCUSS, V92, P173
CATANA A, 1989, I PHYS C SER, V100, P621
FITZGERALD AG, 1993, QANTITATIVE MICROBEA
HSU T, 1992, MICROSC RES TECHNIQ, V20, P318
OURMAZD A, 1990, ULTRAMICROSCOPY, V34, P237
REIMER L, 1984, TRANSMISSION ELECTRO
SPENCE JCH, 1981, EXPT HIGH RESOLUTION
STADELMANN PA, 1987, ULTRAMICROSCOPY, V21, P131
TONOMURA A, 1984, J ELECTRON MICROSC, V33, P101
ZHANG X, 1993, ULTRAMICROSCOPY, V51, P21
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Scientific production and competences > SB - School of Basic Sciences > SB Archives > LOEQ - Laboratory of Quantum Optoelectronics
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-08-31