A low-temperature ultrahigh vacuum atomic force microscope for biological applications

We present an atomic force microscope ~AFM for operation at low temperatures under ultrahigh vacuum conditions. It uses the laser beam deflection method to measure the bending of the cantilever. The four quadrant photodiode allows the detection of vertical and lateral forces. The AFM has been developed for studying biological samples. Images of deoxyribonucleic acid plasmids have been obtained in contact mode.


Published in:
Review of Scientific Instruments, 74, 2, 1022-1026
Year:
2003
Publisher:
American Institute of Physics
ISSN:
0034-6748
Laboratories:




 Record created 2007-06-20, last modified 2018-03-18


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