Characterization of atomic force microscope probes at low temperatures
2003
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Details
Title
Characterization of atomic force microscope probes at low temperatures
Author(s)
Radenovic, A. ; Bystrenova, E. ; Libioulle, L. ; Valle, F. ; Shubeita, G. T. ; Kasas, S. ; Dietler, G.
Published in
Journal of Applied Physics
Volume
94
Issue
6
Pages
4210-4214
Date
2003
Publisher
American Institute of Physics
ISSN
0021-8979
Other identifier(s)
DAR: 4243
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Record Appears in
Scientific production and competences > STI - School of Engineering > IBI-STI - Interfaculty Institute of Bioengineering > LBEN - Laboratory of Nanoscale Biology
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPMV - Laboratory of the Physics of Living Matter
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPMV - Laboratory of the Physics of Living Matter
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-06-20