000109108 001__ 109108
000109108 005__ 20181203020903.0
000109108 0247_ $$2doi$$a10.1063/1.1604952
000109108 022__ $$a0021-8979
000109108 02470 $$2DAR$$a4243
000109108 02470 $$2ISI$$a000185419600080
000109108 037__ $$aARTICLE
000109108 245__ $$aCharacterization of atomic force microscope probes at low temperatures
000109108 269__ $$a2003
000109108 260__ $$bAmerican Institute of Physics$$c2003
000109108 336__ $$aJournal Articles
000109108 700__ $$0240208$$aRadenovic, A.$$g161458
000109108 700__ $$0240893$$aBystrenova, E.$$g162222
000109108 700__ $$aLibioulle, L.
000109108 700__ $$aValle, F.
000109108 700__ $$aShubeita, G. T.
000109108 700__ $$0240307$$aKasas, S.$$g150334
000109108 700__ $$0240091$$aDietler, G.$$g125942
000109108 773__ $$j94$$k6$$q4210-4214$$tJournal of Applied Physics
000109108 909C0 $$0252162$$pLPMV$$xU10868
000109108 909C0 $$0252069$$pLBEN$$xU11842
000109108 909CO $$ooai:infoscience.tind.io:109108$$pSB$$pSTI$$particle
000109108 917Z8 $$x161458
000109108 937__ $$aLPMV-ARTICLE-2003-003
000109108 970__ $$a0000000033/LPMV
000109108 973__ $$aEPFL$$rREVIEWED$$sPUBLISHED
000109108 980__ $$aARTICLE