Characterization of atomic force microscope probes at low temperatures


Published in:
Journal of Applied Physics, 94, 6, 4210-4214
Year:
2003
Publisher:
American Institute of Physics
ISSN:
0021-8979
Other identifiers:
Laboratories:


Note: The status of this file is: Anyone


 Record created 2007-06-20, last modified 2020-10-24


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