Atomic force and scanning tunneling microscopy study of current-voltage properties of TiB2 microcontacts
1997
Details
Title
Atomic force and scanning tunneling microscopy study of current-voltage properties of TiB2 microcontacts
Author(s)
Heuberger, M. ; Dietler, G. ; Strumpler, R. ; Rhyner, J. ; Isberg, J.
Published in
Journal of Applied Physics
Volume
82
Issue
3
Pages
1255-1261
Date
1997
Laboratories
LPMV
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPMV - Laboratory of the Physics of Living Matter
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-06-20