000108946 001__ 108946
000108946 005__ 20180317092609.0
000108946 0247_ $$2doi$$a10.1016/0921-4526(94)90199-6
000108946 037__ $$aARTICLE
000108946 245__ $$aLow-Temperature Scanning-Tunneling-Microscopy
000108946 260__ $$c1994
000108946 269__ $$a1994
000108946 336__ $$aJournal Articles
000108946 700__ $$aReihl, B.
000108946 700__ $$aGimzewski, J. K.
000108946 700__ $$aSchlittler, R.
000108946 700__ $$aTschudy, M.
000108946 700__ $$aBerndt, R.
000108946 700__ $$aGaisch, R.
000108946 700__ $$0240897$$aSchneider, W. D.$$g123542
000108946 773__ $$j197$$k1-4$$q64-71$$tPhysica B
000108946 909CO $$ooai:infoscience.tind.io:108946$$particle
000108946 909C0 $$0252175$$pLPS$$xUS00152
000108946 937__ $$aLPS-ARTICLE-1994-005
000108946 970__ $$a0000000099/LPS
000108946 973__ $$aEPFL$$rREVIEWED$$sPUBLISHED
000108946 980__ $$aARTICLE