Analysis and Modeling of Lateral Non-Uniform Doping in High-Voltage MOSFETs
2006
Details
Title
Analysis and Modeling of Lateral Non-Uniform Doping in High-Voltage MOSFETs
Author(s)
Chauhan, Y. S. ; Krummenacher, F. ; Anghel, C. ; Gillon, R. ; Bakeroot, B. ; Declercq, M. ; Ionescu, A. M.
Published in
IEEE International Electron Device Meeting, IEDM 2006
Date
2006
Other identifier(s)
View record in Web of Science
Laboratories
NANOLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NANOLAB - Nanoelectronic Devices Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-05-16