Hot carrier degradation of lateral DMOS transistor capacitance and reliability issues
2005
Details
Title
Hot carrier degradation of lateral DMOS transistor capacitance and reliability issues
Author(s)
Hefyene, N. ; Anghel, C. ; Gillon, R. ; Ionescu, A. M.
Published in
Proceedings of 43rd Annual IEEE International Reliability Physics Symposium
Pages
551-554
Date
2005
Laboratories
NANOLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NANOLAB - Nanoelectronic Devices Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-05-16