Charge, Current, and Noise Partitioning in MOSFET in the Presence of Mobility Degradation

The Ward-Dutton (WD) partitioning scheme is used extensively to develop transient and high-frequency advanced compact models in MOSFET analysis. However, it remains an open question if this scheme can be used for field-dependent mobility that is enhanced in state-of-the-art submicrometer technologies. In this paper, after demonstrating that the well-known WD partitioning is indeed invalid for field-dependent mobility, the authors develop a very general partitioning strategy that can always be defined in small-signal analysis for any arbitrary velocity-field relationship. It has also been shown that for large-signal operation, the existence of a partitioning scheme can be determined by the solution of an integral equation. © 2006 IEEE.


Published in:
IEEE Electron Device Letters, 27, 8, 674-677
Year:
2006
ISSN:
0741-3106
Keywords:
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Laboratories:




 Record created 2007-05-16, last modified 2018-03-17


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