000102851 001__ 102851
000102851 005__ 20181203020803.0
000102851 0247_ $$2doi$$a10.1007/s10832-004-5114-y
000102851 022__ $$a1385-3449
000102851 02470 $$2DAR$$a6281
000102851 02470 $$2ISI$$a000226236100047
000102851 037__ $$aARTICLE
000102851 245__ $$aThe importance of distributed loading and cantilever angle in piezo-force microscopy
000102851 260__ $$c2004
000102851 269__ $$a2004
000102851 336__ $$aJournal Articles
000102851 700__ $$0241680$$g152676$$aHuey, B. D.
000102851 700__ $$aRamanujan, C.
000102851 700__ $$aBobji, M.
000102851 700__ $$aBlendell, J.
000102851 700__ $$aWhite, G.
000102851 700__ $$0241679$$g130382$$aSzoszkiewicz, R.
000102851 700__ $$aKulik, A.$$g105590$$0240620
000102851 773__ $$j13$$tJournal of Electroceramics$$k1-3$$q287-291
000102851 909C0 $$0252082$$pLNNME
000102851 909CO $$particle$$ooai:infoscience.tind.io:102851
000102851 937__ $$aLNNME-ARTICLE-2004-002
000102851 937__ $$aEPFL-ARTICLE-102851
000102851 970__ $$a20/LNNME
000102851 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000102851 980__ $$aARTICLE