Disorder-induced losses in planar photonic crystals

The phenomenological approach introduced by Benisty et al. [Appl. Phys. Lett. 76, 532 (2000)] to model out-of-plane radiation losses in planar photonic crystals with a low vertical refractive index contrast is extended to the case of in-plane disorder. The model is experimentally validated by means of optical measurements on GaAs-based structures. For the present fabrication techniques the disorder-induced contribution is found to be negligible compared with the other loss mechanisms


Published in:
Optics Letters, 31, 10, 1426
Year:
2006
Publisher:
Opt. Soc. America
Keywords:
Note:
Copyright 2006, The Institution of Engineering and Technology
8900320
0146-9592
disorder-induced losses
planar photonic crystals
phenomenological approach
out-of-plane radiation losses
vertical refractive index contrast
in-plane disorder
optical measurements
GaAs-based structures
loss mechanisms
GaAs
Laboratories:




 Record created 2007-04-03, last modified 2018-01-27


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