Contribution of EELS and quantitative dark field-imaging to the understanding of strain and chemistry in InGaAs quantum wires
2001
Details
Title
Contribution of EELS and quantitative dark field-imaging to the understanding of strain and chemistry in InGaAs quantum wires
Author(s)
Leifer, K ; Rudra, A ; Stauss, S ; Buffat, PA ; Stadelmann, PA ; Kapon, E
Published in
Inst. Phys. Conf. Ser.
Volume
169
Pages
21-24
Date
2001
Other identifier(s)
View record in Web of Science
DAR: 828
DAR: 828
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15