Details
Title
Microscopy of Semiconducting Materials
Author(s)
Cagnon, J ; Buffat, PA ; Stadelmann, PA ; Leifer, K
Published in
Proceeding of the Royal Microscopical Society Conference
Pages
37-40
Date
2001
Publisher
IOP Publishing, Bristol, UK
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15