PEELS Imaging and Linescan Study of Concentration Anisotropies in AlxGa1-xAs and InyGa1-yAs Heterostructures Grown on Non-Planar Substrates
1999
Details
Title
PEELS Imaging and Linescan Study of Concentration Anisotropies in AlxGa1-xAs and InyGa1-yAs Heterostructures Grown on Non-Planar Substrates
Author(s)
Leifer, K ; Rudra, A. ; Biasiol, G. ; Michler, H. ; Blank, E. ; Buffat, P.A. ; Kapon, E.
Published in
Microscopy of Semiconducting Materials
Series
Institute of Physics Conference Series, 164
Pages
27-30
Date
1999
Other identifier(s)
DAR: 1255
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Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15