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000100673 005__ 20180317092831.0
000100673 02470 $$2DAR$$a1255
000100673 02470 $$2ISI$$a000166835300005
000100673 037__ $$aCONF
000100673 245__ $$aPEELS Imaging and Linescan Study of Concentration Anisotropies in AlxGa1-xAs and InyGa1-yAs Heterostructures Grown on Non-Planar Substrates
000100673 269__ $$a1999
000100673 260__ $$c1999
000100673 336__ $$aConference Papers
000100673 490__ $$aInstitute of Physics Conference Series$$v164
000100673 700__ $$0241420$$aLeifer, K$$g102335
000100673 700__ $$0240082$$aRudra, A.$$g106305
000100673 700__ $$aBiasiol, G.
000100673 700__ $$aMichler, H.
000100673 700__ $$aBlank, E.
000100673 700__ $$0240619$$aBuffat, P.A.$$g104664
000100673 700__ $$aKapon, E.
000100673 773__ $$q27-30$$tMicroscopy of Semiconducting Materials
000100673 909CO $$ooai:infoscience.tind.io:100673$$pSB$$pconf
000100673 909C0 $$0252025$$pCIME$$xU10192
000100673 937__ $$aCIME-CONF-1999-002
000100673 970__ $$a471/CIME
000100673 973__ $$aEPFL$$rREVIEWED$$sPUBLISHED
000100673 980__ $$aCONF