Details
Title
Contrast analysis in TEM images of InGaAs/GaAs strained layers grown on non-planar substrates
Published in
Microscopy of Semiconducting Materials. Proc.
Series
Institute of Physics Conference Series
Volume
164
Pages
185-188
Date
1999
Publisher
IOP Publishing LTD
Other identifier(s)
DAR: 1256
View record in Web of Science
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Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15