Details
Title
Electromigration Behavior of a Multi-Layer Metallization
Author(s)
Schönbächler, E
Published in
Series in Micro-electronics
Volume
74
Pages
107-110
Date
1998
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15