Theoretical and experimental limits of the quantitative analysis of III/V semiconductors using EELS
1998
Details
Title
Theoretical and experimental limits of the quantitative analysis of III/V semiconductors using EELS
Author(s)
Leifer, K ; Kapon, E ; Buffat, PA
Published in
ICEM 14
Volume
3
Pages
619-620
Date
1998
Other identifier(s)
View record in Web of Science
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15