A method to determine the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
1998
Details
Title
A method to determine the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
Author(s)
Foeth, M ; Stadelmann, PA ; Buffat, PA
Published in
Proceedings Int. Conf. Electron Microscopy ICEM 14
Volume
2
Pages
585-586
Date
1998
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15