Quantitative determination on the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy


Publié dans:
Proceedings of In-Situ Electron Microscopy, ULTRAMICROSCOPY January 7-10 1999(accepted), 75 (4), 203-213
Année
1998
Publisher:
ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Note:
chercher
Laboratoires:




 Notice créée le 2007-02-15, modifiée le 2019-12-05


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