Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
1998
Details
Title
Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
Author(s)
Foeth, M ; Stadelmann, PA
Published in
Réunion de la Société Suisse de Physique. Bulletin SPG/SSP
Volume
15
Issue
1
Pages
98
Date
1998
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15