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Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy

Foeth, M ; Stadelmann, PA

Published in:
Réunion de la Société Suisse de Physique. Bulletin SPG/SSP, 15, 1, 98
Year:
1998
Laboratories:
CIME

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published



 Record created 2007-02-15, last modified 2018-03-17


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