Infoscience

Conference paper

Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy

Foeth, M; Stadelmann, PA
  • Published in: Réunion de la Société Suisse de Physique. Bulletin SPG/SSP, vol. 15, num. 1, p. 98
  • Publication date: 1998

    Reference

    • CIME-CONF-1998-006

    Record created on 2007-02-15, modified on 2017-05-12

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