Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
Foeth, M; Stadelmann, PA
1998

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Title Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
Author(s) Foeth, M ; Stadelmann, PA
Published in Réunion de la Société Suisse de Physique. Bulletin SPG/SSP
Volume 15
Issue 1
Pages 98
Date 1998
Laboratories CIME
Record Appears in Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
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