A comparison of HREM and Weak Beam Transmission Electron Microscopy for the quantitative measurement of the thickness of ferroelectric domain walls
1998
Details
Title
A comparison of HREM and Weak Beam Transmission Electron Microscopy for the quantitative measurement of the thickness of ferroelectric domain walls
Author(s)
Foeth, M ; Sfera, A ; Buffat, PA ; Stadelmann, PA
Published in
Proceedings of the 2nd Japanese-Swiss Joint Seminar on Electron Microscopies in Material Sciences
Volume
JOURNAL OF ELECTRON MICROSCOPY 48 (6) 1999
Pages
717-723
Date
1998
Publisher
OXFORD UNIV PRESS, GREAT CLARENDON ST, OXFORD OX2 6DP, ENGLAND
Note
chercher
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15