A comparison of HREM and Weak Beam Transmission Electron Microscopy for the quantitative measurement of the thickness of ferroelectric domain walls


Published in:
Proceedings of the 2nd Japanese-Swiss Joint Seminar on Electron Microscopies in Material Sciences, JOURNAL OF ELECTRON MICROSCOPY 48 (6) 1999, 717-723
Year:
1998
Publisher:
OXFORD UNIV PRESS, GREAT CLARENDON ST, OXFORD OX2 6DP, ENGLAND
Note:
chercher
Laboratories:




 Record created 2007-02-15, last modified 2018-03-17


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