Details
Title
Quantitative Analysis of Al1-xGaxAs heterostructures using EELS
Author(s)
Leifer, K ; Buffat, PA
Published in
Microscopy of Semiconducting Materials 1997
Series
Institute of Physics Conference Series, 157
Pages
381-384
Conference
Royal-Microscopical-Society Conference on Microscopy of Semiconducting Materials Location, OXFORD, ENGLAND, APR 07-10, 1997
Date
1997
ISBN
0-7503-0464-2
Other identifier(s)
View record in Web of Science
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15