Effect of the three-fold astigmatism on high resolution electron micrographs
1995
Details
Title
Effect of the three-fold astigmatism on high resolution electron micrographs
Author(s)
Krivanek, OL ; Stadelmann, PA
Published in
Ultramicroscopy
Volume
60
Issue
1
Pages
103-113
Date
1995
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15