Characterization by transmission electron microscopy of gradients in the chemical composition of GaAs/Al/sub x/Ga/sub 1-x/As semiconductor laser structures
1995
Details
Title
Characterization by transmission electron microscopy of gradients in the chemical composition of GaAs/Al/sub x/Ga/sub 1-x/As semiconductor laser structures
Author(s)
Bonard, JM ; Buffat, PA ; Ganière, JD
Published in
3rd Int. Symposium on Structural and Functional Gradient Materials.
Volume
xx-731
Pages
371-376
Date
1995
Publisher
Presses Polytech. Univ. Romandes. Lausanne.
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15