Characterization by transmission electron microscopy of gradients in the chemical composition of GaAs/Al/sub x/Ga/sub 1-x/As semiconductor laser structures


Published in:
3rd Int. Symposium on Structural and Functional Gradient Materials., xx-731, 371-376
Year:
1995
Publisher:
Presses Polytech. Univ. Romandes. Lausanne.
Laboratories:




 Record created 2007-02-15, last modified 2018-03-17


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